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Obras · work_ieee_1226_1998

IEEE Std 1226-1998

IEEE Std 1226-1998 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for a Broad Based Environment for Test (ABBET), Overview and Architecture”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1999 年。

Atualizado · rev 1 · Outros nomes：1226-1998 1226-1998 - IEEE Trial-Use Standard for a Broad Based Environment for Test (ABBET), Overview and Architecture

IEEE Std 1226-1998（IEEE Trial-Use Standard for a Broad Based Environment for Test (ABBET), Overview and Architecture）是电气电子工程师学会的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1999 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[1]。参见IEEE 标准。

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  1. IEEE Std 1226-1998 — IEEE Xplore 题录 · IEEE

    standard_number=1226-1998; status=Inactive; modifier=Withdrawn

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  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01 ↩