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IEEE Std 351-1972

IEEE Std 351-1972 是电气电子工程师学会的技术标准，题为“IEEE Trial Use Standard Guide on Solid State Devices: Varactor Measurements Part II - Characterization of Large-Signal Devices”；公开目录标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1972 年。

Atualizado · rev 1 · Outros nomes：351-1972 351-1972 - IEEE Trial Use Standard Guide on Solid State Devices: Varactor Measurements Part II - Characterization of Large-Signal Devices

IEEE Std 351-1972（IEEE Trial Use Standard Guide on Solid State Devices: Varactor Measurements Part II - Characterization of Large-Signal Devices）是电气电子工程师学会的技术标准。公开目录将其标为非现行（Inactive），已撤回（Withdrawn），著录年份为 1972 年，主题领域包括 Power, Energy and Industry Applications、Components, Circuits, Devices and Systems[1]。参见IEEE 标准。

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  1. IEEE Std 351-1972 — IEEE Xplore 题录 · IEEE

    standard_number=351-1972; status=Inactive; modifier=Withdrawn

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  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01