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Obras · work_ieee_63003_2015

IEEE Std 63003-2015 · História

IEEE Std 63003-2015 是电气电子工程师学会的技术标准，题为“IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。