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Eserler · work_ieee_14515_1_2000_amd_1_2003

IEEE Std 14515-1:2000 /Amd.1-2003

IEEE Std 14515-1:2000 /Amd.1-2003 是电气电子工程师学会的技术标准，题为“ISO/IEC Standard for Information Technology---Portable Operating System Interface (POSIX®)---Test Methods for Measuring Conformance to POSIX---Part 1: System Interfaces---Am”；公开目录标为现行（Active），已批准（Approved），著录年份为 2000 年。

Güncelleme · rev 1 · Diğer adlar：14515-1:2000 /Amd.1-2003 14515-1:2000 /Amd.1-2003 - ISO/IEC Standard for Information Technology---Portable Operating System Interface (POSIX®)---Test Methods for Measuring Conformance to POSIX---Part 1: System Interfaces---Am

IEEE Std 14515-1:2000 /Amd.1-2003（ISO/IEC Standard for Information Technology---Portable Operating System Interface (POSIX®)---Test Methods for Measuring Conformance to POSIX---Part 1: System Interfaces---Am）是电气电子工程师学会的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2000 年，主题领域包括 Components, Circuits, Devices and Systems[1]。参见IEEE 标准。

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  1. IEEE Std 14515-1:2000 /Amd.1-2003 — IEEE Xplore 题录 · IEEE

    standard_number=14515-1:2000 /Amd.1-2003; status=Active; modifier=Approved

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  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01 ↩