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Eserler · work_ieee_1671_5_2008_4733021 · rev 2

IEEE Std 1671.5-2008

IEEE Std 1671.5-2008 是电气电子工程师学会的技术标准，题为“IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information”；公开目录标为已被替代（Superseded），著录年份为 2012 年。

Güncelleme · rev 2 · Diğer adlar：1671.5-2008 1671.5-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

IEEE Std 1671.5-2008（IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information）是电气电子工程师学会的技术标准。公开目录将其标为已被替代（Superseded），著录年份为 2012 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[1]。参见IEEE 标准。

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  1. IEEE Std 1671.5-2008 — IEEE Xplore 题录 · IEEE

    standard_number=1671.5-2008; status=Superseded; modifier=

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  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01