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Eserler · work_ieee_62526_2007

IEEE Std 62526-2007

IEEE Std 62526-2007 是电气电子工程师学会的技术标准，题为“IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments”；公开目录标为现行（Active），已批准（Approved），著录年份为 2007 年。

Güncelleme · rev 1 · Diğer adlar：62526-2007 62526-2007 - IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

IEEE Std 62526-2007（IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments）是电气电子工程师学会的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2007 年，主题领域包括 Components, Circuits, Devices and Systems、Power, Energy and Industry Applications[1]。参见IEEE 标准。

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  1. IEEE Std 62526-2007 — IEEE Xplore 题录 · IEEE

    standard_number=62526-2007; status=Active; modifier=Approved

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  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01 ↩