English translation unavailable — showing Chinese source text.
Works · work_ieee_300_1982
IEEE Std 300-1982 是电气电子工程师学会的技术标准,题为“IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors”;公开目录标为已被替代(Superseded),著录年份为 1992 年。
当前版本
This site only uses the cookies needed to keep editors signed in. The voice assistant is provided by this site: it sends what you type or say to Google Gemini and keeps your choice in this browser. Turn the voice assistant on? Privacy policy