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IEEE Std 641-1987

IEEE Std 641-1987 是电气电子工程师学会的技术标准,题为“IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays”;公开目录标为非现行(Inactive),已撤回(Withdrawn),著录年份为 1988 年。

Dikemas kini · rev 1 · Nama lain:641-1987 641-1987 - IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays

IEEE Std 641-1987(IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays)是电气电子工程师学会的技术标准。公开目录将其标为非现行(Inactive),已撤回(Withdrawn),著录年份为 1988 年,主题领域包括 Components, Circuits, Devices and Systems、Engineered Materials, Dielectrics and Plasmas[1]。参见IEEE 标准。

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  1. IEEE Std 641-1987 — IEEE Xplore 题录 · IEEE

    standard_number=641-1987; status=Inactive; modifier=Withdrawn

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  2. IEEE Xplore All Standards(KBART) · IEEE · 2026-11-01