IEEE Std 510-1983(IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing)是电气电子工程师学会的技术标准。公开目录将其标为非现行(Inactive),已撤回(Withdrawn),著录年份为 1983 年,主题领域包括 Components, Circuits, Devices and Systems[1]。参见IEEE 标准。
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IEEE Std 510-1983
IEEE Std 510-1983 是电气电子工程师学会的技术标准,题为“IEEE Recommended Practices for Safety in High-Voltage and High-Power Testing”;公开目录标为非现行(Inactive),已撤回(Withdrawn),著录年份为 1983 年。
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- IEEE Std 510-1983 — IEEE Xplore 题录 · IEEE
standard_number=510-1983; status=Inactive; modifier=Withdrawn
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