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IEEE Std 63003-2015

IEEE Std 63003-2015 是电气电子工程师学会的技术标准，题为“IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)”；公开目录标为现行（Active），已批准（Approved），著录年份为 2015 年。

Cập nhật · rev 1 · Tên khác：63003-2015 63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)

IEEE Std 63003-2015（IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)）是电气电子工程师学会的技术标准。公开目录将其标为现行（Active），已批准（Approved），著录年份为 2015 年，主题领域包括 Computing and Processing[1]。参见IEEE 标准。

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  1. IEEE Std 63003-2015 — IEEE Xplore 题录 · IEEE

    standard_number=63003-2015; status=Active; modifier=Approved

    ↩ ↩
  2. IEEE Xplore All Standards（KBART） · IEEE · 2026-11-01 ↩